Step-Cut Modification of Air-Forced Heat Sink to Improve Temperature Gradient in Power Semiconductor Modules

Sharp, Andrew, Holzenkamp, Henning, Akinsolu, Mobayode O. and Vagapov, Yuriy (2025) Step-Cut Modification of Air-Forced Heat Sink to Improve Temperature Gradient in Power Semiconductor Modules. In: 21th IEEE East-West Design and Test Symposium EWDTS 2025, Tbilisi, Georgia, 5-8 Dec 2025, Tbilisi, Georgia.

[img] Text
WURO 729 Vagapov.pdf - Published Version
Available under License Creative Commons Attribution.

Download (1MB)

Abstract

The thermal performance of power electronic systems is critically influenced by the ability to maintain uniform temperatures across semiconductor devices. In serially mounted semiconductor arrangements, forced-air cooling often produces a progressive heating effect, causing downstream devices to operate at higher temperatures. This non-uniform thermal loading leads to localised hotspots, accelerated material degradation, and reduced operational reliability. This paper investigates passive geometric optimisation of an air-cooled aluminium heatsink to enhance thermal uniformity across three serially mounted IGBTs. A computational numerical model was developed in ANSYS Fluent, using steady-state simulations and validated by experimental temperature measurements from a physical test rig. The baseline model demonstrated temperature differences across the length of the heatsink of up to 7.85°C at 100W, confirming the presence of a significant temperature gradient. Geometric modifications were evaluated in the form of a step-cut recess in the heatsink fins. The optimised geometry, with recess depths of 31 mm and 14 mm, reduced the temperature difference to 0.43°C under identical operating conditions, representing over 90% improvement compared to the unmodified design. The findings demonstrate that position-specific geometric tailoring of heatsinks offers a cost-effective and manufacturable solution to improve temperature synchronisation in multi-device power systems.

Item Type: Conference or Workshop Item (Paper)
Keywords: power electronics, forced air cooling, temperature gradient, semiconductor reliability
Divisions: Applied Science, Computing and Engineering
Depositing User: Hayley Dennis
Date Deposited: 07 Jan 2026 13:21
Last Modified: 07 Jan 2026 13:21
URI: https://wrexham.repository.guildhe.ac.uk/id/eprint/18396

Actions (login required)

Edit Item Edit Item